Tuesday, April 9, 2019

Measurement of semiconductor material quality is now 100,000 times more sensitive

The enhanced power of the new measuring technique to characterize materials at scales much smaller than any current technologies will accelerate the discovery and investigation of 2-D, micro- and nanoscale materials.

from General Physics News - Science News, Physics News, Physics, Material Sciences, Science http://bit.ly/2U3i1xu

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