Friday, March 1, 2019

New X-ray measurement approach could improve CT scanners

A new measurement approach proposed by scientists at the National Institute of Standards and Technology (NIST) could lead to a better way to calibrate computed tomography (CT) scanners, potentially streamlining patient treatment by improving communication among doctors.

from General Physics News - Science News, Physics News, Physics, Material Sciences, Science https://ift.tt/2Trn4eP

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